Connectors are an integral part of any electronic system, allowing multiple parts of one system to interconnect. However, they represent a discontinuity, and this discontinuity causes reflections, differential-to-common-mode conversion and radiation. All these phenomena are more intense at higher frequencies and they can significantly distort the transmitted signal which leads to the reduction of transmission speed/bitrate.

Prediction of these effects using simulation requires a precise model of the connector with well-defined geometry and materials. The electrical properties of materials are often known up to a certain degree of accuracy, therefore measurement is used for characterization or/and verification. However, measuring such connectors with a Vector Network Analyzer requires the connector to be mounted to a test fixture. In reality these fixtures have parasitic properties, which can be comparable to properties of the connector itself. Measured S-parameters thus contain a mixture of connector properties and fixture parasitics.

With this eSeminar, learn about:

• A technique for the extraction of the connector model from measured S-parameters mitigating the effects of the test-fixture using CST Studio Suite®​​​​​​​. The concept will be demonstrated on the example of a connector for automotive applications

Watch the eSeminar: